Therma-Wave, Inc. develops, manufactures, markets and services process control metrology systems used in the manufacture of semiconductors. Process control metrology is used to monitor process parameters to enable semiconductor manufacturers to maintain high overall manufacturing yield, increase their equipment productivity and reduce the size of the circuit features imprinted on the semiconductor to thereby improve the performance of the semiconductor device. The Company's product families Therma-Probe, Opti-Probe, Opti-Probe CD and real time CD processing (RT/ CD), use the Company's technology to provide precise, non-contact, non-destructive measurement for the basic building blocks, or process modules, used in the manufacture of integrated circuits (ICs). On July 1, 2005, the Company and Tokyo Electron Limited, a Japanese corporation (TEL), completed an Asset Purchase Agreement providing for the sale of the Company's Compact Critical Dimension-integrated (CCD-i) product line, including the Integra integrated metrology product and certain intellectual property rights to TEL. The Company's services include selling parts, billable service calls, and maintenance contracts related to the Company's metrology products. Therma-Probe Product Family The Therma-Probe systems employ Modulated Optical Reflectance (MOR) technology that uses focused, but low power laser beams to generate and detect thermal and plasma wave signals in the silicon wafer. The Therma-Probe systems utilize a non-contact, non-damaging technology and thus can be used to monitor product wafers after the ion implantation and activation processes. These features have been integrated into a package with automated wafer handling and statistical data processing. Therma-Probe's ability to measure non-destructively on actual production IC wafers decreases manufacturing costs by reducing the need for test wafers. In addition, Therma-Probe systems detect implant-processing problems that only affect the product wafers and which cannot be revealed by utilizing test wafer monitoring alone. Opti-Probe Product Family Opti-Probe systems improve upon thin-film metrology systems with the integration of up to five distinct film measurement technologies: beam profile reflectometry (BPR), beam profile ellipsometry (BPE), rotating compensator spectroscopic ellipsometry (RCSE), absolute ellipsometry (AE), and broadband spectroscopy. By combining the measured data from these multiple technologies, Opti-Probe systems provide increased measurement capability. Therma-Wave's latest generation of film thickness metrology product, the Opti-Probe Series 7, integrates all five measurement technologies. The Opti-Probe Series 7 addresses various film measurements needed for 90 nanometer (nm) production, as well as supporting films process development of 65 nm and below technology nodes. Opti-Probe CD and RT/ CD Products Therma-Wave's Opti-Probe CD and RT/ CD products were designed to measure the lateral critical dimensions and cross-sectional shape, or profile, of IC features. The Company's Opti-Probe RT/ CD is an optical critical dimensions (CD) scatterometry system that combines high-information content SE, optical measurement with ultra-fast calculation (real-time regression) to analyze and display results without the use of off-line modeling and solution libraries. Complex CD profiles can be calculated in seconds with precision and repeatability and with structural information not available with standard CD-SEM technologies. The Opti-Probe CD system leverages its established Opti-Probe, thin-film metrology platform for optical data acquisition. This non-destructive CD measurement technology is beneficial for the prevalent microelectronics technology node (130nm), and is extendible to the 65-nm technology node and even beyond for various process applications. Therma-Wave, Inc. competes with QC Solutions, Inc., KLA-Tencor Corporation, Rudolph Technologies, Inc., Nanometrics, Inc. and Accent Optical Technologies.

• Download SqueezeTrigger (TM) Report
• Download FrictionFactor Report
• Download Daily Short Volume Report
• Download Real-Time Short Volume Tool
• Download Failures to Deliver

• [06/08/2026 11:07 PDT] Trustwave Holdings (NASDAQ:TWAV), Up By 100% ($1.66) From $1.66 After BUYINS.NET Report Predicted Stock Would Go Up Due To Bullish Conditions
• [06/08/2026 07:13 PDT] TWAV Expected to Trade Up After Bullish Patterns Develop
• [06/08/2026 06:35 PDT] TWAV Expected to Trade Up Short Term
• [05/15/2026 07:22 PDT] TWAV Expected to Trade Down After Bearish Patterns Develop